The physical-chemical laboratory offers state-of-the-art X-ray diffractometry (XRD) for the analysis of crystal structures, phases, and residual stresses. With high-resolution detectors, flexible measuring modes, and software methods such as Rietveld refinement or 3D-XRD, powders, thin films, and complex components can all be characterized with high precision.

• Bruker D8 Discover with ultra-precise ATLAS goniometer, flexible anode materials and detectors, including high-temperature chamber HTK2000 (25–1400 °C).
• Seifert Charon SXL for large-volume components, high-precision measurements with spot sizes down to 50 μm.
• Mobile X-ray diffractometers (Stresstech Xstress 3000 G2/G3) for depth measurements, internal surfaces, and in-situ analyses.
• Mobile X-ray fluorescence analyzer (Bruker S1 TurboLE) for rapid on-site material analysis.

👉 High-precision X-ray technology – stationary and mobile, from laboratory analysis to in-situ measurement.