Computed Tomography (CT)

Computed tomography (CT) enables three-dimensional, non-destructive analysis of the internal structure of components and materials. It provides precise information on pores, cracks, and structural defects that are often inaccessible using conventional methods. CT therefore makes a significant contribution to quality control, process optimization, and reliability assessment in materials and electronics research.

• Non-destructive, X-ray-based 3D imaging.
• Reconstruction of volumes, internal structures, and defects.

Our focus areas / expertise

• Failure analysis
• Examination of components and materials
  • Weld seam inspection for pores, inclusions, bonding defects, etc.
  • Analysis of joining technologies (pores, cracks, geometry, etc.)
  • Inspection of additively manufactured components (porosity)
• Target/actual comparisons